Correction of aberration for a high-resolution electron hologram by means of the amplitude contrast criterion of image wave
文献类型：期刊论文
| 作者 | Y. M. Wang ; K. Du ; H. Q. Ye ; H. Lichte |
| 刊名 | Micron
 |
| 出版日期 | 2002 |
| 卷号 | 33期号:1页码:15-21 |
| 关键词 | electron microscopy correction of aberration amplitude contrast criterion microscope space |
| ISSN号 | 0968-4328 |
| 中文摘要 | In order to further improve the resolution for a high-resolution electron hologram, the aberration working on the hologram must be corrected. Since it is rather difficult to precisely control aberration coefficients in the experimental stage, we proposed an amplitude contrast D criterion of imaging wave to determine the working aberration from the hologram itself. In the determination or correction of the aberration, we assume a symmetrical aberration function is parameterized only by a spherical aberration coefficient and a defocus value. First, D is calculated from a holographically reconstructed imaging wave of YBa2Cu3O7-x for each combination of these parameters. The working aberration on the imaging wave is determined from the combination of the parameters by noting the maximum or minimum D of the imaging wave at some specifically chosen thickness regions. The theoretical validity for the D criterion is then proved with three-beam dynamical diffraction formula. Finally, the 'experimental' examination for the D criterion is successfully performed on the reconstructed image wave for the Sigma = 9 interface structure of a wedge-shaped silicon sample. (C) 2001 Elsevier Science Ltd. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/36446]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Y. M. Wang,K. Du,H. Q. Ye,et al. Correction of aberration for a high-resolution electron hologram by means of the amplitude contrast criterion of image wave[J]. Micron,2002,33(1):15-21. |
| APA | Y. M. Wang,K. Du,H. Q. Ye,&H. Lichte.(2002).Correction of aberration for a high-resolution electron hologram by means of the amplitude contrast criterion of image wave.Micron,33(1),15-21. |
| MLA | Y. M. Wang,et al."Correction of aberration for a high-resolution electron hologram by means of the amplitude contrast criterion of image wave".Micron 33.1(2002):15-21. |
入库方式： OAI收割
来源：金属研究所
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