Microstructural characterization of Fe-N thin films
文献类型：期刊论文
| 作者 | Q. Zhan ; R. Yu ; L. L. He ; D. X. Li |
| 刊名 | Thin Solid Films
 |
| 出版日期 | 2002 |
| 卷号 | 411期号:2页码:225-228 |
| 关键词 | Fe-N film microstructure HREM single-crystal films fe16n2 films magnetization density moment |
| ISSN号 | 0040-6090 |
| 中文摘要 | The microstructure of Fe-N films with different thicknesses prepared by reactive radio-frequency magnetron sputtering has been investigated by transmission electron microscopy (TEM) and high-resolution transmission electron micrscopy (HREM) in cross-section and plan view. The film showed a small surface roughening at a nanometer scale. Grain clusters were clearly visible in the film. The electron diffraction analysis indicated that the sputtered Fe-N film was polycrystalline with a mixture of alpha-Fe and alpha"-Fe16N2 phases. A small amount of Fe2O3 was also observed. The thickness of the film and crystal size may be important factors causing distinct differences in magnetic properties of sputtered Fe-N films. (C) 2002 Elsevier Science B.V. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/36523]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Q. Zhan,R. Yu,L. L. He,et al. Microstructural characterization of Fe-N thin films[J]. Thin Solid Films,2002,411(2):225-228. |
| APA | Q. Zhan,R. Yu,L. L. He,&D. X. Li.(2002).Microstructural characterization of Fe-N thin films.Thin Solid Films,411(2),225-228. |
| MLA | Q. Zhan,et al."Microstructural characterization of Fe-N thin films".Thin Solid Films 411.2(2002):225-228. |
入库方式： OAI收割
来源：金属研究所
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