Accurate electrical resistance measurement of the crystallization kinetics of amorphous alloys
文献类型：期刊论文
| 作者 | Y. P. Wang ; K. Lu |
| 刊名 | Science in China Series E-Technological Sciences
 |
| 出版日期 | 2001 |
| 卷号 | 44期号:1页码:33-41 |
| 关键词 | electrical resistance amorphous alloys crystallization nucleation growth metallic glasses activation-energies growth |
| ISSN号 | 1006-9321 |
| 中文摘要 | An accurate four-line ac electrical resistance measurement (ERM) apparatus was developed. By using the ERM the crystallization kinetics of amorphous NI80P20, FeZr2, Fe86B14 alloys were investigated. The experimental results show that the ERM can identify the early stage of crystallization in amorphous alloys. The ERM detects a crystallization temperature range obviously wider than the DSC does, indicating that the ERM is more sensitive to the structure evolution in crystallization. For the eutectic or polymorphic crystallization, three distinct processes can be identified from the measured resistance variation: (i) crystal nucleation, (ii) subsequent growth of crystal nuclei, and (iii) coarsening of the crystallites. In the early stage of the primary crystallization, the ERM results reflect the nucleation information as well. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/36835]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Y. P. Wang,K. Lu. Accurate electrical resistance measurement of the crystallization kinetics of amorphous alloys[J]. Science in China Series E-Technological Sciences,2001,44(1):33-41. |
| APA | Y. P. Wang,&K. Lu.(2001).Accurate electrical resistance measurement of the crystallization kinetics of amorphous alloys.Science in China Series E-Technological Sciences,44(1),33-41. |
| MLA | Y. P. Wang,et al."Accurate electrical resistance measurement of the crystallization kinetics of amorphous alloys".Science in China Series E-Technological Sciences 44.1(2001):33-41. |
入库方式： OAI收割
来源：金属研究所
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