中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The structural, dielectric and ferroelectric properties of Bi(3.5)La(0.5)Ti(3)O(12) thin films prepared by sol-gel process

文献类型:期刊论文

作者J. G. Zhu ; C. Yu ; D. Q. Xiao ; L. Shen ; X. W. Yuan ; J. L. Zhu ; X. Yue
刊名Ferroelectrics
出版日期2001
卷号260期号:1-4页码:499-504
关键词bismuth titanate lanthanum doped sol-gel memories srbi2ta2o9
ISSN号0015-0193
中文摘要Lanthanum doped bismuth titanate (Bi(3.5)La(0.5)Ti(3)O(12), BLT-5) thin films were prepared by sol-gel method. Polycrystalline BLT-5 thin films could be obtained at annealing temperatures of 600similar to650 degreesC. The typical coercive electric field (E) and remnant polarization (P,) for the BLT-5 thin film annealed at 650degreesC were E(C)=67 kV/cm, P(r) =11.2 mu C/cm(2), respectively. BLT-5 thin film shows good fatigue-free property.
原文出处://WOS:000177215300027
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/36965]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
J. G. Zhu,C. Yu,D. Q. Xiao,et al. The structural, dielectric and ferroelectric properties of Bi(3.5)La(0.5)Ti(3)O(12) thin films prepared by sol-gel process[J]. Ferroelectrics,2001,260(1-4):499-504.
APA J. G. Zhu.,C. Yu.,D. Q. Xiao.,L. Shen.,X. W. Yuan.,...&X. Yue.(2001).The structural, dielectric and ferroelectric properties of Bi(3.5)La(0.5)Ti(3)O(12) thin films prepared by sol-gel process.Ferroelectrics,260(1-4),499-504.
MLA J. G. Zhu,et al."The structural, dielectric and ferroelectric properties of Bi(3.5)La(0.5)Ti(3)O(12) thin films prepared by sol-gel process".Ferroelectrics 260.1-4(2001):499-504.

入库方式: OAI收割

来源:金属研究所

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