中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning

文献类型:期刊论文

作者S. Y. Li ; J. Zhu ; H. Q. Ye
刊名Journal of Electron Microscopy
出版日期2000
卷号49期号:1页码:173-177
关键词transmission electron microscopy plan-view imaging of surfaces sample preparation electron-solid interaction au(001) surface uhv microscopy si(111)-7x7 diffraction cu(110) film
ISSN号0022-0744
中文摘要The feasibility and the limitation of the 'high-energy electron thinning' method for the production of surface-science-grade samples in situ in the electron microscope are studied. Exploiting the electron beam supplied by high-voltage electron gun in electron microscope, this method can be readily realized. An obvious advantage of this method is that we can monitor the sample surface concurrently. However, this sample preparation method depends strongly on the sample material and the local environment within the electron microscope. Factors relating to the electron thinning speed are briefly discussed.
原文出处://WOS:000086028100021
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/37092]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
S. Y. Li,J. Zhu,H. Q. Ye. Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning[J]. Journal of Electron Microscopy,2000,49(1):173-177.
APA S. Y. Li,J. Zhu,&H. Q. Ye.(2000).Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning.Journal of Electron Microscopy,49(1),173-177.
MLA S. Y. Li,et al."Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning".Journal of Electron Microscopy 49.1(2000):173-177.

入库方式: OAI收割

来源:金属研究所

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