High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy
文献类型:期刊论文
作者 | R. Yu ; L. L. He ; Z. X. Jin ; J. T. Guo ; H. Q. Ye ; V. Lupinc |
刊名 | Zeitschrift Fur Metallkunde
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出版日期 | 2000 |
卷号 | 91期号:4页码:272-274 |
关键词 | creep deformation gamma |
ISSN号 | 0044-3093 |
中文摘要 | The microstructure of a Ti-47Al-2W-0.5Si alloy has been investigated using high-resolution electron microscopy and analytical electron microscopy. From the three main phases, i.e. gamma, alpha(2) and B2, many precipitates: are formed. Ti(5)Si(3) particles formed in the equiaxed grains match well with the gamma matrix. A new orientation relationship has been identified between the Ti(5)Si(3) and gamma phase. Due to the stabilizing effect of W, B2 phase is formed in the alloy, and it contains much more W, more Si and shows a higher Ti to Al ratio in comparison with the equiaxed gamma phase. Moreover, the gamma precipitates formed in the B2 phase contain small amounts of W and Si. In the (gamma + alpha(2)) lamellar structure, Ti(5)Si(3) and B2 particles are formed. The Ti(5)Si(3) particles were formed mainly by the dissolution of the preliminary B2 particles. This is atcributed to the enrichment of Si and the Ti to Al ratio in the B2 phase. |
原文出处 | |
公开日期 | 2012-04-14 |
源URL | [http://ir.imr.ac.cn/handle/321006/37232] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | R. Yu,L. L. He,Z. X. Jin,et al. High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy[J]. Zeitschrift Fur Metallkunde,2000,91(4):272-274. |
APA | R. Yu,L. L. He,Z. X. Jin,J. T. Guo,H. Q. Ye,&V. Lupinc.(2000).High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy.Zeitschrift Fur Metallkunde,91(4),272-274. |
MLA | R. Yu,et al."High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy".Zeitschrift Fur Metallkunde 91.4(2000):272-274. |
入库方式: OAI收割
来源:金属研究所
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