Characteristics of the stress relaxation in the thinned two-phase multilayer materials
文献类型：期刊论文
| 作者 | C. R. Chen ; Y. Liu ; S. X. Li |
| 刊名 | Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
 |
| 出版日期 | 1999 |
| 卷号 | 265期号:1-2页码:146-152 |
| 关键词 | relaxation stress surface scanning electron microscopy beam electron-diffraction elastic relaxation microscopy layers |
| ISSN号 | 0921-5093 |
| 中文摘要 | In the two-phase multilayer bulk material, strong inner stress field may exist if the thermal expansion coefficient of one phase is distinctly different from that of another phase. When a sample is thinned in cross section of the bulk material for studying by transmission electron microscopy (TEM), stress relaxation will occur in the sample. Thus, stress and strain states in the sample are different from that in the bulk material. In this paper, the finite element method was employed to analyze the characteristics about stress relaxation in the sample when the sample was separated from the bulk material. Results show that: larger residual stresses still remain near the interface; the shear stress field is formed at the local interface region near the free surface, and; stresses change drastically near the intersection of interface and free surface. When the ratio of the sample thickness to the layer thickness is small, the stress sigma(zz) (perpendicular to the sample surface) relaxes throughout the sample thickness in the region remote from the interface, and this stress remains only near the interface. When the ratio of the sample thickness to the layer thickness is large, stress relaxation occurs only near the free surface. (C) 1999 Elsevier Science S.A. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/37312]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | C. R. Chen,Y. Liu,S. X. Li. Characteristics of the stress relaxation in the thinned two-phase multilayer materials[J]. Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,1999,265(1-2):146-152. |
| APA | C. R. Chen,Y. Liu,&S. X. Li.(1999).Characteristics of the stress relaxation in the thinned two-phase multilayer materials.Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,265(1-2),146-152. |
| MLA | C. R. Chen,et al."Characteristics of the stress relaxation in the thinned two-phase multilayer materials".Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing 265.1-2(1999):146-152. |
入库方式： OAI收割
来源：金属研究所
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