Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN
文献类型：期刊论文
| 作者 | W. H. Sun ; K. M. Chen ; Z. J. Yang ; J. Li ; Y. Z. Tong ; S. X. Jin ; G. Y. Zhang ; Q. L. Zhang ; G. G. Qin |
| 刊名 | Journal of Applied Physics
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| 出版日期 | 1999 |
| 卷号 | 85期号:9页码:6430-6433 |
| 关键词 | resonant raman-scattering hydrogen carbon films gaas absorption growth |
| ISSN号 | 0021-8979 |
| 中文摘要 | Both Fourier transform infrared (FTIR) grazing incidence reflectivity and FTIR transmission methods have been used to study GaN films grown on alpha-Al2O3 (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. The results show that in the frequency range from 400 to 3500 cm(-1) the signal-to-noise ratio of the FTIR grazing incidence measurement is far higher than that of the FTIR transmission measurement. Some new vibrational structures appearing in the former measurement have been discussed. The features around 1460 and 1300 cm(-1) are tentatively assigned to scissoring and wagging local vibrational modes of CH2 in GaN, respectively. (C) 1999 American Institute of Physics. [S0021-8979(99)06509-3]. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/37493]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | W. H. Sun,K. M. Chen,Z. J. Yang,et al. Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN[J]. Journal of Applied Physics,1999,85(9):6430-6433. |
| APA | W. H. Sun.,K. M. Chen.,Z. J. Yang.,J. Li.,Y. Z. Tong.,...&G. G. Qin.(1999).Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN.Journal of Applied Physics,85(9),6430-6433. |
| MLA | W. H. Sun,et al."Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN".Journal of Applied Physics 85.9(1999):6430-6433. |
入库方式： OAI收割
来源：金属研究所
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