中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electroluminescence from indium tin oxide film/nanoscale Si oxide/p-Si structure

文献类型:期刊论文

作者Y. Q. Wang ; T. P. Zhao ; X. M. Cui ; Z. C. Ma ; W. H. Zong ; G. G. Qin
刊名Chinese Physics Letters
出版日期1999
卷号16期号:8页码:605-607
关键词visible electroluminescence porous silicon p-si diodes films
ISSN号0256-307X
中文摘要After an Si oxide layer of 3 nm thickness had been grown by using magnetron sputtering on a p-type Si (100) substrate, an indium tin oxide (ITO) film was deposited onto the Si oxide layer by using electron beam deposition. Electroluminescence (EL) from such an ITO/Si oxide/p-type Si structure was measured under a forward bias of 5 V or more. Its EL power efficiency is about eight times as large as that of a semitransparent Au/Si oxide (3 nm)/p-Si structure. The experimental results indicate that the greater EL power efficiency is due not only to the higher optical transparency of the ITO film compared with Au film in a range of 300 to 900 nm, but also to some new luminescence centers introduced in the Si oxide layer during the ITO deposition process.
原文出处://WOS:000082288500022
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/37525]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Y. Q. Wang,T. P. Zhao,X. M. Cui,et al. Electroluminescence from indium tin oxide film/nanoscale Si oxide/p-Si structure[J]. Chinese Physics Letters,1999,16(8):605-607.
APA Y. Q. Wang,T. P. Zhao,X. M. Cui,Z. C. Ma,W. H. Zong,&G. G. Qin.(1999).Electroluminescence from indium tin oxide film/nanoscale Si oxide/p-Si structure.Chinese Physics Letters,16(8),605-607.
MLA Y. Q. Wang,et al."Electroluminescence from indium tin oxide film/nanoscale Si oxide/p-Si structure".Chinese Physics Letters 16.8(1999):605-607.

入库方式: OAI收割

来源:金属研究所

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