Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy
文献类型：期刊论文
| 作者 | Z. F. Dong ; L. M. Peng ; R. Luck ; K. Lu |
| 刊名 | Philosophical Magazine Letters
 |
| 出版日期 | 1998 |
| 卷号 | 77期号:6页码:345-350 |
| 关键词 | grain-growth |
| ISSN号 | 0950-0839 |
| 中文摘要 | The thermal stability of a nanocrystalline (NC) Hf11Ni89 alloy was studied using X-ray diffraction, transmission electron microscopy, resistivity measurements and magnetothermal analysis. Microstructure and composition evolution in the grain boundaries and nanograins prior to evident grain growth was detected, and it was shown that this evolution may have a significant influence on the electrical resistivity and magnetic properties of the sample. Our findings demonstrated that the thermal stability of properties of NC materials is not necessarily equivalent to the grain-size stability of the same materials. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/37652]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Z. F. Dong,L. M. Peng,R. Luck,et al. Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy[J]. Philosophical Magazine Letters,1998,77(6):345-350. |
| APA | Z. F. Dong,L. M. Peng,R. Luck,&K. Lu.(1998).Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy.Philosophical Magazine Letters,77(6),345-350. |
| MLA | Z. F. Dong,et al."Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy".Philosophical Magazine Letters 77.6(1998):345-350. |
入库方式： OAI收割
来源：金属研究所
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