Applications of microdiffraction related to HREM
文献类型：期刊论文
| 作者 | J. Zhu ; X. F. Duan ; D. X. Li ; H. Q. Ye |
| 刊名 | Microscopy Research and Technique
 |
| 出版日期 | 1998 |
| 卷号 | 40期号:2页码:122-135 |
| 关键词 | coherence of source domain boundary stacking fault interference fringe strain field beam electron-diffraction strained-layer superlattices antiphase domain boundaries elastic relaxation micro-diffraction crystals dislocations distortions specimens phase |
| ISSN号 | 1059-910X |
| 中文摘要 | This paper deals with the coherent and the incoherent microdiffraction, as well as their applications, for example, determination of the nature of defects and boundaries, measurement of the strain field and identification of the symmetry, etc. The localized structure information obtained from microdiffraction has been compared with and complements that provided by HREM. (C) 1998 Wiley-Liss, Inc. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/37927]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | J. Zhu,X. F. Duan,D. X. Li,et al. Applications of microdiffraction related to HREM[J]. Microscopy Research and Technique,1998,40(2):122-135. |
| APA | J. Zhu,X. F. Duan,D. X. Li,&H. Q. Ye.(1998).Applications of microdiffraction related to HREM.Microscopy Research and Technique,40(2),122-135. |
| MLA | J. Zhu,et al."Applications of microdiffraction related to HREM".Microscopy Research and Technique 40.2(1998):122-135. |
入库方式： OAI收割
来源：金属研究所
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