中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Initial interface reaction in indium/amorphous selenium multilayer thin films

文献类型:期刊论文

作者K. Lu ; J. H. Perepezko ; K. A. Lindahl ; B. Lanning
刊名Philosophical Magazine Letters
出版日期1997
卷号76期号:4页码:299-305
关键词nucleation growth
ISSN号0950-0839
中文摘要Interface reactions between In and amorphous Se (a-Se) layers have been studied using differential scanning calorimetry (DSC) in vapour-deposited multilayer thin films. The initial interface reaction started at around 100 degrees C with the formation of an In2Se stoichiometric compound. A kinetic analysis indicated that the interface reaction is characterized by the two-dimensional growth of preexisting In2Se nuclei to coalescence in the plane of the original In-a-Se interface. The heating onset and peak temperatures and the isothermal peak time for the reaction in the DSC scans were found to be independent of the multilayer modulation wavelength, implying a constant nucleation site density with different multilayer wavelengths.
原文出处://WOS:A1997XY66200008
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/38040]  
专题金属研究所_中国科学院金属研究所
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GB/T 7714
K. Lu,J. H. Perepezko,K. A. Lindahl,et al. Initial interface reaction in indium/amorphous selenium multilayer thin films[J]. Philosophical Magazine Letters,1997,76(4):299-305.
APA K. Lu,J. H. Perepezko,K. A. Lindahl,&B. Lanning.(1997).Initial interface reaction in indium/amorphous selenium multilayer thin films.Philosophical Magazine Letters,76(4),299-305.
MLA K. Lu,et al."Initial interface reaction in indium/amorphous selenium multilayer thin films".Philosophical Magazine Letters 76.4(1997):299-305.

入库方式: OAI收割

来源:金属研究所

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