The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing
文献类型:期刊论文
作者 | K. Zhang ; I. V. Alexandrov ; K. Lu |
刊名 | Nanostructured Materials
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出版日期 | 1997 |
卷号 | 9期号:1-8页码:347-350 |
关键词 | crystalline |
ISSN号 | 0965-9773 |
中文摘要 | The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data fi om an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn. (C) 1997 Acta Metallurgica Inc. |
原文出处 | |
公开日期 | 2012-04-14 |
源URL | [http://ir.imr.ac.cn/handle/321006/38205] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | K. Zhang,I. V. Alexandrov,K. Lu. The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing[J]. Nanostructured Materials,1997,9(1-8):347-350. |
APA | K. Zhang,I. V. Alexandrov,&K. Lu.(1997).The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing.Nanostructured Materials,9(1-8),347-350. |
MLA | K. Zhang,et al."The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing".Nanostructured Materials 9.1-8(1997):347-350. |
入库方式: OAI收割
来源:金属研究所
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