中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing

文献类型:期刊论文

作者K. Zhang ; I. V. Alexandrov ; K. Lu
刊名Nanostructured Materials
出版日期1997
卷号9期号:1-8页码:347-350
关键词crystalline
ISSN号0965-9773
中文摘要The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data fi om an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn. (C) 1997 Acta Metallurgica Inc.
原文出处://WOS:A1997XB96900069
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/38205]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
K. Zhang,I. V. Alexandrov,K. Lu. The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing[J]. Nanostructured Materials,1997,9(1-8):347-350.
APA K. Zhang,I. V. Alexandrov,&K. Lu.(1997).The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing.Nanostructured Materials,9(1-8),347-350.
MLA K. Zhang,et al."The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing".Nanostructured Materials 9.1-8(1997):347-350.

入库方式: OAI收割

来源:金属研究所

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