Effect of low temperature treatment regime on residual stress state near interface in bonded SiC/6061Al compounds
文献类型：期刊论文
| 作者 | H. Li ; J. B. Li ; L. Z. Sun ; S. X. Li ; Z. G. Wang |
| 刊名 | Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
 |
| 出版日期 | 1996 |
| 卷号 | 221期号:1-2页码:179-186 |
| 关键词 | finite element method low temperature treatment residual stress state composite matrix |
| ISSN号 | 0921-5093 |
| 中文摘要 | The residual stress distributions near the interface in diffusion-bonded SiC/6061Al model samples of various treated states were determined by means of X-ray stress measurement and finite element method (FEM). It was demonstrated that the low temperature treatment and subsequent reheating to room temperature might be used to reduce or even eliminate the residual stresses. The results of FEM calculations are in agreement with the trend of the experimental results, but show higher magnitudes of computed residual stresses. The reasons for the deviation are explained. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/38316]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | H. Li,J. B. Li,L. Z. Sun,et al. Effect of low temperature treatment regime on residual stress state near interface in bonded SiC/6061Al compounds[J]. Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,1996,221(1-2):179-186. |
| APA | H. Li,J. B. Li,L. Z. Sun,S. X. Li,&Z. G. Wang.(1996).Effect of low temperature treatment regime on residual stress state near interface in bonded SiC/6061Al compounds.Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,221(1-2),179-186. |
| MLA | H. Li,et al."Effect of low temperature treatment regime on residual stress state near interface in bonded SiC/6061Al compounds".Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing 221.1-2(1996):179-186. |
入库方式： OAI收割
来源：金属研究所
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