The microstructure of Ti-B-N film-substrate interfaces
文献类型：期刊论文
| 作者 | Q. Q. Yang ; L. H. Zhao ; H. Q. Du ; L. S. Wen |
| 刊名 | Surface & Coatings Technology
 |
| 出版日期 | 1996 |
| 卷号 | 81期号:2-3页码:287-289 |
| ISSN号 | 0257-8972 |
| 关键词 | interfaces ion bombardment microstructure coatings |
| 中文摘要 | Ti-B-N films were deposited on W18Cr4V high speed steels by using N ion bombardment on an electron beam ion plated Ti-B film. Scanning electron microscopy and transmission electron microscopy morphology of the samples shows that the films are found to have a dense and fine nanocrystalline structure, and a dense close interface bonding exists between the film and the substrate. Auger electron spectroscopy depth profiling analysis of the film indicates that N and Ti penetrate into the substrate, resulting in a wide interfacial diffusion zone, which is about 150 nm. Microdiffraction patterns of the interface show that FeTi, Fe2Ti, and Ti2N phases exist in the interfacial diffusion zone. The results obtained indicate that the method of bombarding the him by N ions extends the film-substrate interfacial diffusion zone and stimulates the interfacial chemical reaction. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/38455]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Q. Q. Yang,L. H. Zhao,H. Q. Du,et al. The microstructure of Ti-B-N film-substrate interfaces[J]. Surface & Coatings Technology,1996,81(2-3):287-289. |
| APA | Q. Q. Yang,L. H. Zhao,H. Q. Du,&L. S. Wen.(1996).The microstructure of Ti-B-N film-substrate interfaces.Surface & Coatings Technology,81(2-3),287-289. |
| MLA | Q. Q. Yang,et al."The microstructure of Ti-B-N film-substrate interfaces".Surface & Coatings Technology 81.2-3(1996):287-289. |
入库方式： OAI收割
来源：金属研究所
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