Structural characterization of nanocrystalline copper by means of x-ray diffraction
文献类型：期刊论文
| 作者 | K. Zhang ; I. V. Alexandrov ; R. Z. Valiev ; K. Lu |
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 1996 |
| 卷号 | 80期号:10页码:5617-5624 |
| 关键词 | pd |
| ISSN号 | 0021-8979 |
| 中文摘要 | Quantitative x-ray-diffraction measurements were performed on a nanocrystalline Cu sample made by severe plastic deformation. The shape of Bragg reflections was found to be represented primarily by a Lorentzian function. A difference of as much as 6%+/-3% was revealed between the integrated intensities from the nanocrystalline and a reference coarse-grained Cu samples. The broadening of Bragg reflections from the nanocrystalline Cu sample was mainly induced by small crystallite sizes and microstrains inside the grains and/or the deformed layers near the grain boundaries. It was found that the grain sizes of nanocrystalline Cu in different crystallographic orientations are essentially the same, while the microstrains exhibit a significant anisotropy. The Debye-Waller parameter B of the nanocrystalline Cu sample was 0.97+/-0.06 Angstrom(2), which suggests that the atomic displacement from their ideal lattice positions equals on average 0.111+/-0.004 Angstrom or 4.3% of the nearest-neighbor spacing. (C) 1996 American Institute of Physics. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/38479]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | K. Zhang,I. V. Alexandrov,R. Z. Valiev,et al. Structural characterization of nanocrystalline copper by means of x-ray diffraction[J]. Journal of Applied Physics,1996,80(10):5617-5624. |
| APA | K. Zhang,I. V. Alexandrov,R. Z. Valiev,&K. Lu.(1996).Structural characterization of nanocrystalline copper by means of x-ray diffraction.Journal of Applied Physics,80(10),5617-5624. |
| MLA | K. Zhang,et al."Structural characterization of nanocrystalline copper by means of x-ray diffraction".Journal of Applied Physics 80.10(1996):5617-5624. |
入库方式： OAI收割
来源：金属研究所
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