CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS
文献类型:期刊论文
作者 | D. X. Li ; H. Q. Ye |
刊名 | Journal of Materials Science & Technology
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出版日期 | 1995 |
卷号 | 11期号:4页码:235-259 |
关键词 | juxtaposed pentagonal antiprisms two-dimensional quasicrystal domain boundary structures close-packed phases nanocrystalline materials crystal-structure copper oxidation initial-stage translational symmetry rotational symmetry |
ISSN号 | 1005-0302 |
中文摘要 | The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing. |
原文出处 | |
公开日期 | 2012-04-14 |
源URL | [http://ir.imr.ac.cn/handle/321006/38584] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | D. X. Li,H. Q. Ye. CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS[J]. Journal of Materials Science & Technology,1995,11(4):235-259. |
APA | D. X. Li,&H. Q. Ye.(1995).CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS.Journal of Materials Science & Technology,11(4),235-259. |
MLA | D. X. Li,et al."CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS".Journal of Materials Science & Technology 11.4(1995):235-259. |
入库方式: OAI收割
来源:金属研究所
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