中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
THE STUDY OF LATTICE STRAIN AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY IN ZNSE-ZNS STRAINED-LAYER SUPERLATTICES

文献类型:期刊论文

作者Z. P. Guan ; S. H. Song ; G. H. Fan ; X. W. Fan ; Y. G. Peng ; Y. K. Wu
刊名Journal of Crystal Growth
出版日期1994
卷号138期号:1-4页码:534-537
ISSN号0022-0248
关键词epitaxial multilayers dislocations defects
中文摘要The structural properties of ZnSe-ZnS strained-layer superlattices (SLSs) grown on GaAs (100) by atmospheric-pressure metalorganic chemical vapor deposition (AP-MOCVD) were studied using high-resolution transmission electron microscopy (HRTEM). The type and distribution of the defects in ZnSe-ZnS SLS are related to the surface quality of GaAs substrate, of the buffer layer and the thickness of each layer for ZnSe and ZnS in SLS. In this work we noticed that there are stacking faults (SFs), mismatch defects (MDs) and microtwins (MTs) in ZnSe1-xSx buffer layer at interfacial steps due to the GaAs surface not being smooth, and the dislocation can penetrate the ZnSe-ZnS SLS layer.
原文出处://WOS:A1994NN99700096
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/38813]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Z. P. Guan,S. H. Song,G. H. Fan,et al. THE STUDY OF LATTICE STRAIN AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY IN ZNSE-ZNS STRAINED-LAYER SUPERLATTICES[J]. Journal of Crystal Growth,1994,138(1-4):534-537.
APA Z. P. Guan,S. H. Song,G. H. Fan,X. W. Fan,Y. G. Peng,&Y. K. Wu.(1994).THE STUDY OF LATTICE STRAIN AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY IN ZNSE-ZNS STRAINED-LAYER SUPERLATTICES.Journal of Crystal Growth,138(1-4),534-537.
MLA Z. P. Guan,et al."THE STUDY OF LATTICE STRAIN AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY IN ZNSE-ZNS STRAINED-LAYER SUPERLATTICES".Journal of Crystal Growth 138.1-4(1994):534-537.

入库方式: OAI收割

来源:金属研究所

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