ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP
文献类型：期刊论文
| 作者 | S. X. Li ; Z. G. Wang ; S. G. Psakhie |
| 刊名 | Physica Status Solidi a-Applied Research
 |
| 出版日期 | 1993 |
| 卷号 | 139期号:1页码:95-100 |
| 关键词 | atomic-structure |
| ISSN号 | 0031-8965 |
| 中文摘要 | In this paper a molecular dynamic (MD) simulation is conducted to analyze the stress field near a micro-crack tip. The model material for simulation is a single crystal of aluminum. A bulk of 5460 atoms is used to simulate a micro-crack. The interatomic potential of aluminum is calculated by the pseudopotential method of the Krasko-Gurskii model which takes into account the exchange-correlation effects in the dielectric function. From the MD results, a model to describe the stress field of the micro-crack is proposed. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/39060]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | S. X. Li,Z. G. Wang,S. G. Psakhie. ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP[J]. Physica Status Solidi a-Applied Research,1993,139(1):95-100. |
| APA | S. X. Li,Z. G. Wang,&S. G. Psakhie.(1993).ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP.Physica Status Solidi a-Applied Research,139(1),95-100. |
| MLA | S. X. Li,et al."ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP".Physica Status Solidi a-Applied Research 139.1(1993):95-100. |
入库方式： OAI收割
来源：金属研究所
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