中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
DONOR IMPURITY STATES ON STRUCTURED SEMICONDUCTOR INTERFACES

文献类型:期刊论文

作者H. Sun ; S. W. Gu
刊名Physical Review B
出版日期1992
卷号46期号:4页码:2244-2249
关键词quantum wells shallow-donor si/sio2 interface vicinal surfaces confinement resistance roughness spectra energy
ISSN号1098-0121
中文摘要Ground-state energies of shallow states of donor impurities on periodically structured interfaces formed by two semiconductors, such as GaAs/Ga1-xAlxAs and Si/SiO2 interfaces, are calculated variationally with the approximation that interfaces represent infinitely high potential barriers. The results show that the ground-state energies of the interface impurity states can be strongly affected by interface structures in GaAs/Ga1-xAlxAs lateral surface superlattices produced by molecular-beam-epitaxy growth of AlAs/GaAs fractional-layer superlattices on [001] vicinal GaAs substrates and on SiO2/Si interfaces for Si with (001) orientation. The effects of the interface defects on the interface impurity states are negligible for Si/SiO2 interfaces when the density of interface defects is less than 10(10)/cm2.
原文出处://WOS:A1992JE92800035
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/39290]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
H. Sun,S. W. Gu. DONOR IMPURITY STATES ON STRUCTURED SEMICONDUCTOR INTERFACES[J]. Physical Review B,1992,46(4):2244-2249.
APA H. Sun,&S. W. Gu.(1992).DONOR IMPURITY STATES ON STRUCTURED SEMICONDUCTOR INTERFACES.Physical Review B,46(4),2244-2249.
MLA H. Sun,et al."DONOR IMPURITY STATES ON STRUCTURED SEMICONDUCTOR INTERFACES".Physical Review B 46.4(1992):2244-2249.

入库方式: OAI收割

来源:金属研究所

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