中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
High-Performance4H-SiC-based metal-insulator-semiconductor ultraviolet photodetectors with SiO2 and Al2O3SiO2 Films

文献类型:期刊论文

作者Zhang, Feng ; Sun, Guosheng ; Huang, Huolin ; Wu, Zhengyun ; Wang, Lei ; Zhao, Wanshun ; Liu, Xingfang ; Yan, Guoguo ; Zheng, Liu ; Dong, Lin ; Zeng, Yiping
刊名ieee electron device letters
出版日期2011
卷号32期号:12页码:1722-1724
ISSN号07413106
关键词Integrated circuits Metal insulator boundaries Photodetectors Semiconducting silicon compounds Semiconductor insulator boundaries Silicon carbide
通讯作者zhang, f.(fzhang@semi.ac.cn)
学科主题半导体材料
收录类别EI
语种英语
公开日期2012-06-14
源URL[http://ir.semi.ac.cn/handle/172111/23114]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Zhang, Feng,Sun, Guosheng,Huang, Huolin,et al. High-Performance4H-SiC-based metal-insulator-semiconductor ultraviolet photodetectors with SiO2 and Al2O3SiO2 Films[J]. ieee electron device letters,2011,32(12):1722-1724.
APA Zhang, Feng.,Sun, Guosheng.,Huang, Huolin.,Wu, Zhengyun.,Wang, Lei.,...&Zeng, Yiping.(2011).High-Performance4H-SiC-based metal-insulator-semiconductor ultraviolet photodetectors with SiO2 and Al2O3SiO2 Films.ieee electron device letters,32(12),1722-1724.
MLA Zhang, Feng,et al."High-Performance4H-SiC-based metal-insulator-semiconductor ultraviolet photodetectors with SiO2 and Al2O3SiO2 Films".ieee electron device letters 32.12(2011):1722-1724.

入库方式: OAI收割

来源:半导体研究所

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