中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of gas pressure on the properties of silicon thin film

文献类型:期刊论文

作者Hao, Hui-Ying ; Li, Wei-Min ; Zeng, Xiang-Bo ; Kong, Guang-Lin ; Liao, Xian-Bo
刊名gongneng cailiao/journal of functional materials
出版日期2011
卷号42期号:8页码:1489-1491
ISSN号10019731
关键词Amorphous films Chemical vapor deposition Deposition Microcrystalline silicon Microstructure Photoelectricity Plasma deposition Plasma enhanced chemical vapor deposition Pressure effects Semiconducting silicon compounds Transport properties
通讯作者hao, h.-y.
学科主题半导体材料
收录类别EI
语种中文
公开日期2012-06-14
源URL[http://ir.semi.ac.cn/handle/172111/23121]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Hao, Hui-Ying,Li, Wei-Min,Zeng, Xiang-Bo,et al. Effect of gas pressure on the properties of silicon thin film[J]. gongneng cailiao/journal of functional materials,2011,42(8):1489-1491.
APA Hao, Hui-Ying,Li, Wei-Min,Zeng, Xiang-Bo,Kong, Guang-Lin,&Liao, Xian-Bo.(2011).Effect of gas pressure on the properties of silicon thin film.gongneng cailiao/journal of functional materials,42(8),1489-1491.
MLA Hao, Hui-Ying,et al."Effect of gas pressure on the properties of silicon thin film".gongneng cailiao/journal of functional materials 42.8(2011):1489-1491.

入库方式: OAI收割

来源:半导体研究所

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