Effect of gas pressure on the properties of silicon thin film
文献类型:期刊论文
作者 | Hao, Hui-Ying ; Li, Wei-Min ; Zeng, Xiang-Bo ; Kong, Guang-Lin ; Liao, Xian-Bo |
刊名 | gongneng cailiao/journal of functional materials |
出版日期 | 2011 |
卷号 | 42期号:8页码:1489-1491 |
ISSN号 | 10019731 |
关键词 | Amorphous films Chemical vapor deposition Deposition Microcrystalline silicon Microstructure Photoelectricity Plasma deposition Plasma enhanced chemical vapor deposition Pressure effects Semiconducting silicon compounds Transport properties |
通讯作者 | hao, h.-y. |
学科主题 | 半导体材料 |
收录类别 | EI |
语种 | 中文 |
公开日期 | 2012-06-14 |
源URL | [http://ir.semi.ac.cn/handle/172111/23121] |
专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
推荐引用方式 GB/T 7714 | Hao, Hui-Ying,Li, Wei-Min,Zeng, Xiang-Bo,et al. Effect of gas pressure on the properties of silicon thin film[J]. gongneng cailiao/journal of functional materials,2011,42(8):1489-1491. |
APA | Hao, Hui-Ying,Li, Wei-Min,Zeng, Xiang-Bo,Kong, Guang-Lin,&Liao, Xian-Bo.(2011).Effect of gas pressure on the properties of silicon thin film.gongneng cailiao/journal of functional materials,42(8),1489-1491. |
MLA | Hao, Hui-Ying,et al."Effect of gas pressure on the properties of silicon thin film".gongneng cailiao/journal of functional materials 42.8(2011):1489-1491. |
入库方式: OAI收割
来源:半导体研究所
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