中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy

文献类型:期刊论文

作者Li, Zhiwei ; Zhang, Biao ; Wang, Jun ; Liu, Jianming ; Liu, Xianglin ; Yang, Shaoyan ; Zhu, Qinsheng ; Wang, Zhanguo
刊名nanoscale research letters
出版日期2011
卷号6页码:1-4
关键词Conduction bands Photons X ray photoelectron spectroscopy Zinc sulfide
ISSN号19317573
通讯作者li, z.(lizhiwei@semi.ac.cn)
学科主题半导体材料
收录类别EI
语种英语
公开日期2012-06-14
源URL[http://ir.semi.ac.cn/handle/172111/23126]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Li, Zhiwei,Zhang, Biao,Wang, Jun,et al. Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy[J]. nanoscale research letters,2011,6:1-4.
APA Li, Zhiwei.,Zhang, Biao.,Wang, Jun.,Liu, Jianming.,Liu, Xianglin.,...&Wang, Zhanguo.(2011).Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy.nanoscale research letters,6,1-4.
MLA Li, Zhiwei,et al."Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy".nanoscale research letters 6(2011):1-4.

入库方式: OAI收割

来源:半导体研究所

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