Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF
文献类型：期刊论文
| 作者 | Qiu, Jifang ; Yin, Zuoshan ; Sun, Kai ; Chen, Lawrence R. ; Rochette, Martin ; Wu, Jian ; Zhao, Lingjuan ; Wang, Wei |
| 刊名 | 16th opto-electronics and communications conference, oecc2011
 |
| 出版日期 | 2011 |
| 页码 | 573-574 |
| 通讯作者 | qiu, j.(jifangqiu@semi.ac.cn) |
| 学科主题 | 半导体材料 |
| 收录类别 | EI |
| 公开日期 | 2012-06-14 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/23137]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Qiu, Jifang,Yin, Zuoshan,Sun, Kai,et al. Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF[J]. 16th opto-electronics and communications conference, oecc2011,2011:573-574. |
| APA | Qiu, Jifang.,Yin, Zuoshan.,Sun, Kai.,Chen, Lawrence R..,Rochette, Martin.,...&Wang, Wei.(2011).Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF.16th opto-electronics and communications conference, oecc2011,573-574. |
| MLA | Qiu, Jifang,et al."Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF".16th opto-electronics and communications conference, oecc2011 (2011):573-574. |
入库方式： OAI收割
来源：半导体研究所
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