Target detection against strong light based on gate viewing
文献类型:期刊论文
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作者 | Xinwei, Wang; Yan, Zhou; Songtao, Fan; Yuliang, Liu; Xinwei, W.(wangxinwei@semi.ac.cn) |
刊名 | proceedings of spie- the international society for optical engineering
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出版日期 | 2011 ; 2011 |
卷号 | 8200页码:82000v |
关键词 | Optical instruments Target tracking Technology Optical Instruments Target Tracking Technology |
ISSN号 | 0277786x ; 0277786X |
通讯作者 | xinwei, w.(wangxinwei@semi.ac.cn) |
英文摘要 | We present a method of target detection against strong light based on gate viewing. In this method, a nanosecond-scale gate shutter is used to control the exposure time of CCD and reduce the collection of obtrusive light, and a nanosecond-scale pulsed laser is used to illuminate targets and increase signal energy. By matching them, the ratio between signal and obtrusive light will be significantly improved to detect targets against light disturbance. We have analyzed the method in theory, and performed it in experiment. In addition, a stroboscopic time sequence is used, and the setting of temporal parameters is also discussed.?2011 SPIE CCC code. |
学科主题 | 光电子学 ; 光电子学 |
收录类别 | EI |
语种 | 英语 ; 英语 |
公开日期 | 2012-06-14 ; 2012-06-14 |
源URL | [http://ir.semi.ac.cn/handle/172111/23083] ![]() |
专题 | 半导体研究所_光电系统实验室 |
通讯作者 | Xinwei, W.(wangxinwei@semi.ac.cn) |
推荐引用方式 GB/T 7714 | Xinwei, Wang,Yan, Zhou,Songtao, Fan,et al. Target detection against strong light based on gate viewing, Target detection against strong light based on gate viewing[J]. proceedings of spie- the international society for optical engineering, Proceedings of SPIE- The International Society for Optical Engineering,2011, 2011,8200, 8200:82000v, 82000V. |
APA | Xinwei, Wang,Yan, Zhou,Songtao, Fan,Yuliang, Liu,&Xinwei, W..(2011).Target detection against strong light based on gate viewing.proceedings of spie- the international society for optical engineering,8200,82000v. |
MLA | Xinwei, Wang,et al."Target detection against strong light based on gate viewing".proceedings of spie- the international society for optical engineering 8200(2011):82000v. |
入库方式: OAI收割
来源:半导体研究所
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