Influence of window layer thickness on double layer antireflection coating for triple junction solar cells
文献类型:期刊论文
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作者 | Wang, Lijuan; Zhan, Feng; Yu, Ying; Zhu, Yan; Liu, Shaoqing; Huang, Shesong; Ni, Haiqiao; Niu, Zhichuan; Wang, L.(ljwang09@semi.ac.cn) |
刊名 | journal of semiconductors
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出版日期 | 2011 ; 2011 |
卷号 | 32期号:6页码:66001 |
关键词 | Antireflection coatings Coatings Gallium Optimization Silicon compounds Titanium dioxide Transfer matrix method Zinc sulfide Antireflection Coatings Coatings Gallium Optimization Silicon Compounds Titanium Dioxide Transfer Matrix Method Zinc Sulfide |
ISSN号 | 16744926 ; 16744926 |
通讯作者 | wang, l.(ljwang09@semi.ac.cn) |
英文摘要 | The optimization of a SiO2/TiO2, SiO2/ZnS double layer antireflection coating(ARC) on Ga0.5In0.5P/In0.02Ga0.98As/Ge solar cells for terrestrial application is discussed. The Al0.5In0.5P window layer thickness is also taken into consideration. It is shown that the optimal parameters of double layer ARC vary with the thickness of the window layer.?2011 Chinese Institute of Electronics. |
学科主题 | 半导体物理 ; 半导体物理 |
收录类别 | EI |
语种 | 英语 ; 英语 |
公开日期 | 2012-06-14 ; 2012-06-14 |
源URL | [http://ir.semi.ac.cn/handle/172111/23047] ![]() |
专题 | 半导体研究所_半导体超晶格国家重点实验室 |
通讯作者 | Wang, L.(ljwang09@semi.ac.cn) |
推荐引用方式 GB/T 7714 | Wang, Lijuan,Zhan, Feng,Yu, Ying,et al. Influence of window layer thickness on double layer antireflection coating for triple junction solar cells, Influence of window layer thickness on double layer antireflection coating for triple junction solar cells[J]. journal of semiconductors, Journal of Semiconductors,2011, 2011,32, 32(6):66001, 66001. |
APA | Wang, Lijuan.,Zhan, Feng.,Yu, Ying.,Zhu, Yan.,Liu, Shaoqing.,...&Wang, L..(2011).Influence of window layer thickness on double layer antireflection coating for triple junction solar cells.journal of semiconductors,32(6),66001. |
MLA | Wang, Lijuan,et al."Influence of window layer thickness on double layer antireflection coating for triple junction solar cells".journal of semiconductors 32.6(2011):66001. |
入库方式: OAI收割
来源:半导体研究所
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