Slightly off-axis interferometry for microscopy with second wavelength assistance
文献类型：期刊论文
| 作者 | Han, Junhe1; Gao, Peng2; Yao, Baoli2 ; Gu, Yuzong1; Huang, Mingju1
|
| 刊名 | applied optics
 |
| 出版日期 | 2011-06-10 |
| 卷号 | 50期号:17页码:2793-2798 |
| 关键词 | DIGITAL HOLOGRAPHIC MICROSCOPY PHASE-SHIFTING INTERFEROMETRY ZERO-ORDER NUMERICAL RECONSTRUCTION IMAGE COMPENSATION SUPPRESSION DYNAMICS SPECTRUM |
| ISSN号 | 0003-6935 |
| 英文摘要 | slightly off-axis interferometry for microscopy has been performed, where the dc term of the interferogram is suppressed by the object wave in another wavelength. one wavelength of the laser beam (red light) is used to generate the slightly off-axis interferogram, while the second wavelength (blue light) is employed to measure the transmittance of the specimen. both the red light and blue light are recorded simultaneously by a color ccd camera and can be separated without cross talk via the red-green-blue components. the dc term of the slightly off-axis interferogram of red light is suppressed with the object wave of blue light. as a consequence, the requirement on the off-axis angle between the object and reference waves is relaxed as well as the requirement on the resolving power of ccd camera. (c) 2011 optical society of america |
| WOS标题词 | science & technology ; physical sciences |
| 类目[WOS] | optics |
| 研究领域[WOS] | optics |
| 关键词[WOS] | digital holographic microscopy ; phase-shifting interferometry ; zero-order ; numerical reconstruction ; image ; compensation ; suppression ; dynamics ; spectrum |
| 收录类别 | SCI ; EI |
| 原文出处 | http://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-50-17-2793 |
| 语种 | 英语 |
| WOS记录号 | WOS:000291872800037 |
| 公开日期 | 2012-06-29 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/19776]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
| 作者单位 | 1.Henan Univ, Sch Phys & Elect, Kaifeng 475004, Peoples R China 2.Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China |
| 推荐引用方式 GB/T 7714 | Han, Junhe,Gao, Peng,Yao, Baoli,et al. Slightly off-axis interferometry for microscopy with second wavelength assistance[J]. applied optics,2011,50(17):2793-2798. |
| APA | Han, Junhe,Gao, Peng,Yao, Baoli,Gu, Yuzong,&Huang, Mingju.(2011).Slightly off-axis interferometry for microscopy with second wavelength assistance.applied optics,50(17),2793-2798. |
| MLA | Han, Junhe,et al."Slightly off-axis interferometry for microscopy with second wavelength assistance".applied optics 50.17(2011):2793-2798. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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