Influencing factors on local reduction of graphene oxide with a heated AFM tip
文献类型:期刊论文
作者 | Wu Zhongliang ; Shen Yue ; Zhou Xingfei ; Guo Shouwu ; Zhang Yi(张益) |
刊名 | NUCLEAR SCIENCE AND TECHNIQUES
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出版日期 | 2011 |
卷号 | 22期号:4页码:245 |
ISSN号 | 1001-8042 |
英文摘要 | In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible. |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000294942400010 |
公开日期 | 2012-07-04 |
源URL | [http://ir.sinap.ac.cn/handle/331007/9527] ![]() |
专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
推荐引用方式 GB/T 7714 | Wu Zhongliang,Shen Yue,Zhou Xingfei,et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. NUCLEAR SCIENCE AND TECHNIQUES,2011,22(4):245. |
APA | Wu Zhongliang,Shen Yue,Zhou Xingfei,Guo Shouwu,&Zhang Yi.(2011).Influencing factors on local reduction of graphene oxide with a heated AFM tip.NUCLEAR SCIENCE AND TECHNIQUES,22(4),245. |
MLA | Wu Zhongliang,et al."Influencing factors on local reduction of graphene oxide with a heated AFM tip".NUCLEAR SCIENCE AND TECHNIQUES 22.4(2011):245. |
入库方式: OAI收割
来源:上海应用物理研究所
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