中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influencing factors on local reduction of graphene oxide with a heated AFM tip

文献类型:期刊论文

作者Wu Zhongliang ; Shen Yue ; Zhou Xingfei ; Guo Shouwu ; Zhang Yi(张益)
刊名NUCLEAR SCIENCE AND TECHNIQUES
出版日期2011
卷号22期号:4页码:245
ISSN号1001-8042
英文摘要In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible.
收录类别SCI
语种英语
WOS记录号WOS:000294942400010
公开日期2012-07-04
源URL[http://ir.sinap.ac.cn/handle/331007/9527]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式
GB/T 7714
Wu Zhongliang,Shen Yue,Zhou Xingfei,et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. NUCLEAR SCIENCE AND TECHNIQUES,2011,22(4):245.
APA Wu Zhongliang,Shen Yue,Zhou Xingfei,Guo Shouwu,&Zhang Yi.(2011).Influencing factors on local reduction of graphene oxide with a heated AFM tip.NUCLEAR SCIENCE AND TECHNIQUES,22(4),245.
MLA Wu Zhongliang,et al."Influencing factors on local reduction of graphene oxide with a heated AFM tip".NUCLEAR SCIENCE AND TECHNIQUES 22.4(2011):245.

入库方式: OAI收割

来源:上海应用物理研究所

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