中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET

文献类型:期刊论文

作者Liu, ZL ; Hu, ZY ; Zhang, ZX ; Shao, H ; Ning, Bingxu ; Chen, M ; Bi, Dawei ; Zou, SC
刊名Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS.RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
出版日期2011
期号0页码:28-35
通讯作者Liu, Z.(liuzhangli@mail.sim.ac.cn)
公开日期2012-08-28
源URL[http://ir.sim.ac.cn/handle/331004/109333]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
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GB/T 7714
Liu, ZL,Hu, ZY,Zhang, ZX,et al. Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET[J]. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS.RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings,2011(0):28-35.
APA Liu, ZL.,Hu, ZY.,Zhang, ZX.,Shao, H.,Ning, Bingxu.,...&Zou, SC.(2011).Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET.Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS.RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings(0),28-35.
MLA Liu, ZL,et al."Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET".Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS.RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings .0(2011):28-35.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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