中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Preliminary experimental results of deep levels for dielectronic recombination in He-like high-Z ions at Heidelberg electron beam ion trap

文献类型:期刊论文

作者Zhang, XM ; Guo, PL(郭盘林) ; Gonzalez, A ; Crespo, J
刊名CHINESE PHYSICS LETTERS
出版日期2003
卷号20期号:5页码:657
ISSN号0256-307X
英文摘要An experimental system for dielectronic recombination was set-up on H-EBIT in order to carry out dielectronic recombination study. Some preliminary results of He-like Ge32+ and Cu27+ are obtained. Space charge shift on determination of the resonance position for Ge32+ at 100mA is around 18% and that for Cu27+ is around 38%. Further analysis of experimental data is in progress.
收录类别SCI
语种英语
WOS记录号WOS:000182922700019
公开日期2012-09-25
源URL[http://ir.sinap.ac.cn/handle/331007/10110]  
专题上海应用物理研究所_中科院上海原子核所2003年前
推荐引用方式
GB/T 7714
Zhang, XM,Guo, PL,Gonzalez, A,et al. Preliminary experimental results of deep levels for dielectronic recombination in He-like high-Z ions at Heidelberg electron beam ion trap[J]. CHINESE PHYSICS LETTERS,2003,20(5):657.
APA Zhang, XM,Guo, PL,Gonzalez, A,&Crespo, J.(2003).Preliminary experimental results of deep levels for dielectronic recombination in He-like high-Z ions at Heidelberg electron beam ion trap.CHINESE PHYSICS LETTERS,20(5),657.
MLA Zhang, XM,et al."Preliminary experimental results of deep levels for dielectronic recombination in He-like high-Z ions at Heidelberg electron beam ion trap".CHINESE PHYSICS LETTERS 20.5(2003):657.

入库方式: OAI收割

来源:上海应用物理研究所

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