中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique

文献类型:期刊论文

作者Lu, R(陆嵘嵘) ; Manfredotti, C ; Fizzotti, F ; Vittone, E ; Jaksic, M
刊名MATERIALS RESEARCH BULLETIN
出版日期2001
卷号36期号:40910页码:47
ISSN号0025-5408
英文摘要Lateral micro-ion beam induced charge (IBIC) is a powerful method to characterize the electrical behavior of chemical vapor deposition (CVD) diamond thin film and further to evaluate its quality. In the process of IBIC data handling, a new model that the product of mobility and lifetime linearly increases from substrate side to growth side was proposed in order to separately analyze the carriers' contributions to charge collection efficiency. IBIC results shows that CVD diamond was primed by irradiation of 46 Gy proton dose with a 82.4% increase of average collection distance due to the space charge elimination inside the CVD diamond after irradiation. (C) 2001 Elsevier Science Ltd. All rights reserved.
收录类别SCI
语种英语
WOS记录号WOS:000168362600005
公开日期2012-09-25
源URL[http://ir.sinap.ac.cn/handle/331007/10188]  
专题上海应用物理研究所_中科院上海原子核所2003年前
推荐引用方式
GB/T 7714
Lu, R,Manfredotti, C,Fizzotti, F,et al. Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique[J]. MATERIALS RESEARCH BULLETIN,2001,36(40910):47.
APA Lu, R,Manfredotti, C,Fizzotti, F,Vittone, E,&Jaksic, M.(2001).Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique.MATERIALS RESEARCH BULLETIN,36(40910),47.
MLA Lu, R,et al."Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique".MATERIALS RESEARCH BULLETIN 36.40910(2001):47.

入库方式: OAI收割

来源:上海应用物理研究所

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