中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared

文献类型:期刊论文

作者Wei qingnong
刊名infrared physics & technology
出版日期2008
卷号51
学科主题环境光学监测技术
公开日期2012-11-16
源URL[http://ir.hfcas.ac.cn/handle/334002/8374]  
专题合肥物质科学研究院_中科院安徽光学精密机械研究所
推荐引用方式
GB/T 7714
Wei qingnong. A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared[J]. infrared physics & technology,2008,51.
APA Wei qingnong.(2008).A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared.infrared physics & technology,51.
MLA Wei qingnong."A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared".infrared physics & technology 51(2008).

入库方式: OAI收割

来源:合肥物质科学研究院

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