中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structure and optical properties of InN and InAlN films grown by rf magnetron sputtering

文献类型:期刊论文

作者H. He, Y. G. Cao, R. L. Fu, H. Wang, J. Q. Huang, C. G. Huang, M. L. Wang and Z. H. Deng
刊名Journal of Materials Science-Materials in Electronics
出版日期2010-07
卷号21期号:7页码:676-681
关键词fundamental-band gap electronic-structure bragg mirrors thin-films epitaxy heterostructures absorption alxin1-xn alloys alinn
ISSN号0957-4522
收录类别SCI
原文出处http://www.springerlink.com/content/l333360810208294/fulltext.pdf
语种英语
公开日期2012-11-02
源URL[http://ir.fjirsm.ac.cn/handle/335002/2072]  
专题福建物质结构研究所_中科院福建物质结构研究所_期刊论文
推荐引用方式
GB/T 7714
H. He, Y. G. Cao, R. L. Fu, H. Wang, J. Q. Huang, C. G. Huang, M. L. Wang and Z. H. Deng. Structure and optical properties of InN and InAlN films grown by rf magnetron sputtering[J]. Journal of Materials Science-Materials in Electronics,2010,21(7):676-681.
APA H. He, Y. G. Cao, R. L. Fu, H. Wang, J. Q. Huang, C. G. Huang, M. L. Wang and Z. H. Deng.(2010).Structure and optical properties of InN and InAlN films grown by rf magnetron sputtering.Journal of Materials Science-Materials in Electronics,21(7),676-681.
MLA H. He, Y. G. Cao, R. L. Fu, H. Wang, J. Q. Huang, C. G. Huang, M. L. Wang and Z. H. Deng."Structure and optical properties of InN and InAlN films grown by rf magnetron sputtering".Journal of Materials Science-Materials in Electronics 21.7(2010):676-681.

入库方式: OAI收割

来源:福建物质结构研究所

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