半導体レ-ザの戻り光雑音測定方法
文献类型：专利
| 作者 | 田渕 規夫; 山口 隆夫 |
| 发表日期 | 1994-08-03 |
| 专利号 | JP1994058287B2 |
| 著作权人 | 三洋電機株式会社 |
| 国家 | 日本 |
| 文献子类 | 授权发明 |
| 其他题名 | 半導体レ-ザの戻り光雑音測定方法 |
| 英文摘要 | PURPOSE:To facilitate the alignment of the focal matching position of a mirror and to simplify an optical system, by vibrating an article to be irradiated at amplitude frequency of about several ten mum in an optical axis direction and measuring the change quantity of return beam from the article to be irradiated. CONSTITUTION:For example, a mirror 2 is vibrated around the focus thereof in the optical axis direction under such a condition that amplitude is 10-50mum and a cycle is 0.001-0.1Hz while laser beam is emitted from a semiconductor laser Hereupon, laser beam is condensed to the surface of the mirror 2 and the beam condensing part comes to an imaginary beam source and the condensed beam is contrarily condensed to the emitting surface of the semiconductor laser The beam condensing degree of the emitting surface of the semiconductor laser 1 changes by the position of the mirror 2 and the quantity of return beam changes corresponding thereto. Noise is measured from the change rate of the quantity of return light to the positional change of the mirror 2. |
| 公开日期 | 1994-08-03 |
| 申请日期 | 1985-10-19 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/33254]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | 三洋電機株式会社 |
| 推荐引用方式 GB/T 7714 | 田渕 規夫,山口 隆夫. 半導体レ-ザの戻り光雑音測定方法. JP1994058287B2. 1994-08-03. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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