Optical sensor, optical examination device, and optical property detection method
文献类型：专利
| 作者 | ISHII, TOSHIHIRO; TAKAHASHI, YOICHIRO; CHUBACHI, SUNAO; FUJIWARA, MASAYUKI; SASAKI, TOSHIHIDE; ADACHI, KAZUHIKO |
| 发表日期 | 2019-01-08 |
| 专利号 | US10177530 |
| 著作权人 | RICOH COMPANY, LTD. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Optical sensor, optical examination device, and optical property detection method |
| 英文摘要 | An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation. |
| 公开日期 | 2019-01-08 |
| 申请日期 | 2016-12-15 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/34331]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | RICOH COMPANY, LTD. |
| 推荐引用方式 GB/T 7714 | ISHII, TOSHIHIRO,TAKAHASHI, YOICHIRO,CHUBACHI, SUNAO,et al. Optical sensor, optical examination device, and optical property detection method. US10177530. 2019-01-08. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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