Testing device for laser diode
文献类型：专利
| 作者 | LEE, BING-HENG; TSENG, KUO-FONG |
| 发表日期 | 2014-05-20 |
| 专利号 | US8729696 |
| 著作权人 | HON HAI PRECISION INDUSTRY CO., LTD. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Testing device for laser diode |
| 英文摘要 | In a testing method for an LD, an LD die is held. Then, electric current increasing with a fixed increment and having a sequence of current values is supplied to the LD die to drive the LD die to emit light and a sequence of voltage values across the LD die and corresponding to the sequence of current values, respectively, is metered. A sequence of power values corresponding to the sequence of current values, respectively, is also metered. Next, an electro-optical property of the LD die is determined according to the sequence of current values, the sequence of voltage values, and the sequence of power values. Finally, if the LD die is determined to be qualified based upon the electro-optical property of the LD die, the LD die is packaged into the LD. |
| 公开日期 | 2014-05-20 |
| 申请日期 | 2012-06-27 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/34526]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | HON HAI PRECISION INDUSTRY CO., LTD. |
| 推荐引用方式 GB/T 7714 | LEE, BING-HENG,TSENG, KUO-FONG. Testing device for laser diode. US8729696. 2014-05-20. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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