Method of manufacturing high-quality semiconductor light-emitting devices
文献类型：专利
| 作者 | ACKERMAN, DAVID A.; CAMARDA, RENATO M.; HARTMAN, ROBERT L.; SPECTOR, MAGALY |
| 发表日期 | 1987-08-04 |
| 专利号 | US4684883 |
| 著作权人 | BELL TELEPHONE LABORATORIES, INCORPORATED A CORP OF NY |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Method of manufacturing high-quality semiconductor light-emitting devices |
| 英文摘要 | A nondestructive method is proposed for measuring stripe dimensions in order to grade light-emitting structures such as lasers. The width of the near-field emission parallel to the stripe is measured while the laser is operating below threshold. This measurement is correlated with the actual stripe width and with the possibility of kinks developing in the light output. The width of the far-field emission perpendicular to the junction plane can also be measured, and the product of the two widths can be correlated with the stripe area and the possibility of kinks in the laser output. |
| 公开日期 | 1987-08-04 |
| 申请日期 | 1985-05-13 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/34544]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | BELL TELEPHONE LABORATORIES, INCORPORATED A CORP OF NY |
| 推荐引用方式 GB/T 7714 | ACKERMAN, DAVID A.,CAMARDA, RENATO M.,HARTMAN, ROBERT L.,et al. Method of manufacturing high-quality semiconductor light-emitting devices. US4684883. 1987-08-04. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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