Optical frequency analyzer using a local oscillator heterodyne detection of incident light
文献类型:专利
作者 | IWAOKA, HIDETO; OHTE, AKIRA; AKIYAMA, KOJI |
发表日期 | 1989-08-15 |
专利号 | US4856899 |
著作权人 | YOKOGAWA ELECTRIC CORPORATION |
国家 | 美国 |
文献子类 | 授权发明 |
其他题名 | Optical frequency analyzer using a local oscillator heterodyne detection of incident light |
英文摘要 | An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator, wherein the local oscillator comprises an optical frequency synthesizer/sweeper or a marker signal attached tunable laser. The optical frequency analyzer can be modified to measure the incident light itself as the object of measurement or light emerging from the object of measurement can be the incident light. |
公开日期 | 1989-08-15 |
申请日期 | 1986-12-18 |
状态 | 失效 |
源URL | [http://ir.opt.ac.cn/handle/181661/34548] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | YOKOGAWA ELECTRIC CORPORATION |
推荐引用方式 GB/T 7714 | IWAOKA, HIDETO,OHTE, AKIRA,AKIYAMA, KOJI. Optical frequency analyzer using a local oscillator heterodyne detection of incident light. US4856899. 1989-08-15. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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