中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optical frequency analyzer using a local oscillator heterodyne detection of incident light

文献类型:专利

作者IWAOKA, HIDETO; OHTE, AKIRA; AKIYAMA, KOJI
发表日期1989-08-15
专利号US4856899
著作权人YOKOGAWA ELECTRIC CORPORATION
国家美国
文献子类授权发明
其他题名Optical frequency analyzer using a local oscillator heterodyne detection of incident light
英文摘要An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator, wherein the local oscillator comprises an optical frequency synthesizer/sweeper or a marker signal attached tunable laser. The optical frequency analyzer can be modified to measure the incident light itself as the object of measurement or light emerging from the object of measurement can be the incident light.
公开日期1989-08-15
申请日期1986-12-18
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/34548]  
专题半导体激光器专利数据库
作者单位YOKOGAWA ELECTRIC CORPORATION
推荐引用方式
GB/T 7714
IWAOKA, HIDETO,OHTE, AKIRA,AKIYAMA, KOJI. Optical frequency analyzer using a local oscillator heterodyne detection of incident light. US4856899. 1989-08-15.

入库方式: OAI收割

来源:西安光学精密机械研究所

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