中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Technique for measuring semiconductor laser chirp

文献类型:专利

作者SHERIDAN-ENG, JULIE
发表日期2000-02-15
专利号US6026105
著作权人LUCENT TECHNOLOGIES INC.
国家美国
文献子类授权发明
其他题名Technique for measuring semiconductor laser chirp
英文摘要A technique for characterizing laser chirp utilizes an optical fiber and its inherent interferometric properties. An RF modulating signal is applied to the laser, where the modulated output signal thereafter propagates through a conventional optical fiber. A photoreceiver and spectrum analyzer are coupled to the opposite end of the optical fiber. By adjusting the power of the applied RF signal, the maximum IIN can be determined. The laser chirp can then be calculated by dividing the measurement frequency by the modulation current associated with the maximum IIN value.
公开日期2000-02-15
申请日期1998-02-23
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/35235]  
专题半导体激光器专利数据库
作者单位LUCENT TECHNOLOGIES INC.
推荐引用方式
GB/T 7714
SHERIDAN-ENG, JULIE. Technique for measuring semiconductor laser chirp. US6026105. 2000-02-15.

入库方式: OAI收割

来源:西安光学精密机械研究所

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