中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Multi-layer semiconductor devices with stress-relief profiles

文献类型:专利

作者SRINIVASAN, SWAMINATHAN; PATEL, RUSHIKESH M.
发表日期2001-01-23
专利号US6178189
著作权人OPTO POWER CORPORATION
国家美国
文献子类授权发明
其他题名Multi-layer semiconductor devices with stress-relief profiles
英文摘要Multi-layer, semiconductor devices are configured to reduce stress by the removal of much of the structure which does not actually contribute to device performance. In one embodiment, trough between mesas which define light emitting facets in a laser diode bar are etched well into the substrate to remove all layers of different compositions there. In another embodiment, troughs are also etched in the backside of the substrate of a laser diode structure where the troughs are aligned along axes perpendicular to the axes of the mesas. The removal of stress permits more accurate alignment of the multiple facets along a single axis when the laser bar is bonded to a heat sink. The accurate alignment minimizes the placement constraints on the position of a microlens for achieving maximum power output and coupling efficiency for optical fibers coupled to the microlens.
公开日期2001-01-23
申请日期1999-05-03
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/35294]  
专题半导体激光器专利数据库
作者单位OPTO POWER CORPORATION
推荐引用方式
GB/T 7714
SRINIVASAN, SWAMINATHAN,PATEL, RUSHIKESH M.. Multi-layer semiconductor devices with stress-relief profiles. US6178189. 2001-01-23.

入库方式: OAI收割

来源:西安光学精密机械研究所

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