中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Method and apparatus for performing optical frequency domain reflectometry

文献类型:专利

作者SWANSON, ERIC A.; CHINN, STEPHEN R.
发表日期2000-12-12
专利号US6160826
著作权人MASSACHUSETTS INSTITUTE OF TECHNOLOGY
国家美国
文献子类授权发明
其他题名Method and apparatus for performing optical frequency domain reflectometry
英文摘要Method of performing OFDR on a sample comprising steps of: providing an external-cavity frequency-tuned laser having an optical cavity of effective length; tuning the laser to generate a change in wavelength; changing the effective length of the optical cavity proportionally to the change in wavelength so as to tune the longitudinal cavity mode frequency at the same rate as the wavelength is changed; directing light from the laser onto the sample; receiving light reflected from the sample; combining light reflected from the sample with light from the external-cavity frequency-tuned laser; detecting the combined light and generating a beat signal in response thereto; and performing digital signal processing to extract spatial information about the sample in response to the detected beat signal. An OFDR system is also disclosed comprising: a laser comprising an output port; an optical ring having a round trip time, a center frequency and a broad-bandwidth gain medium; a wavelength selecting device in optical communication with the gain medium; a frequency shifter in optical communication with the gain medium and the wavelength selecting device; and an optical coupler in optical communication with the optical gain medium, the wavelength selecting device, and the frequency shifter. The optical coupler couples light from the optical ring to the output port, wherein the wavelength selecting device tunes the center wavelength at a rate equal to the incremental change in frequency caused by the frequency shifter divided by the round trip time of the optical ring thereby providing nearly continuous frequency sweep.
公开日期2000-12-12
申请日期1999-06-11
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/35303]  
专题半导体激光器专利数据库
作者单位MASSACHUSETTS INSTITUTE OF TECHNOLOGY
推荐引用方式
GB/T 7714
SWANSON, ERIC A.,CHINN, STEPHEN R.. Method and apparatus for performing optical frequency domain reflectometry. US6160826. 2000-12-12.

入库方式: OAI收割

来源:西安光学精密机械研究所

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