Etalon, a wavelength monitor/locker using the etalon and associated methods
文献类型：专利
| 作者 | FELDMAN, MICHAEL R.; HAN, HONGTAO; HAMMOND, JOHN BARNETT |
| 发表日期 | 2003-12-09 |
| 专利号 | US6661818 |
| 著作权人 | NAN CHANG O-FILM OPTOELECTRONICS TECHNOLOGY LTD |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Etalon, a wavelength monitor/locker using the etalon and associated methods |
| 英文摘要 | An etalon used in analyzing a wavelength of a light source includes ant etalon only in a portion of a substrate in which the etalon is integrated. Use of such an etalon in monitoring or controlling the wavelength allows the etalon to be placed in an application beam. A portion of the application beam is split into at least two beams, a first beam being directed to the etalon to monitor the wavelength, and the other beam either serving purely as a reference beam or passing through another etalon having a different optical path length than the etalon for the first beam, thereby also monitoring the wavelength. The monitor itself would include at least two photodetector, one for each of the beam split off of the input beam. Any or all substrates containing the elements for the monitor may be created on a wafer level and diced and/or bonded to other wafers containing other elements and diced. |
| 公开日期 | 2003-12-09 |
| 申请日期 | 2000-04-05 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/35342]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | NAN CHANG O-FILM OPTOELECTRONICS TECHNOLOGY LTD |
| 推荐引用方式 GB/T 7714 | FELDMAN, MICHAEL R.,HAN, HONGTAO,HAMMOND, JOHN BARNETT. Etalon, a wavelength monitor/locker using the etalon and associated methods. US6661818. 2003-12-09. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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