中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Method of improving the fabrication of etched semiconductor devices

文献类型:专利

作者JOSEPH, JOHN R.; LUO, WENLIN; LEAR, KEVIN L.; BRYAN, ROBERT P.
发表日期2003-11-11
专利号US6645848
著作权人SUMITOMO ELECTRIC DEVICE INNOVATIONS, U.S.A., INC.
国家美国
文献子类授权发明
其他题名Method of improving the fabrication of etched semiconductor devices
英文摘要This invention relates to a method of improving the fabrication of etched semiconductor devices by using a patterned adhesion promoter layer over a hydrocarbon planarization material. More specifically, the present invention improves the bonding of a metal interconnect layer to a hydrocarbon planarization material, such as polyimide, by inserting an adhesion promotion layer, such as silicon nitride, between the hydrocarbon planarization material and the metal interconnect layer. A process for improving the fabrication of etched semiconductor devices, comprises the steps of: (1) depositing a hydrocarbon planarization material over a substrate; (2) depositing an adhesion promoter over the hydrocarbon planarization material; (3) defining a first mask and etching back the adhesion promoter so as to form an adhesion promoter pad over a portion of the hydrocarbon planarization material; and (4) depositing a first metal over the adhesion promoter pad.
公开日期2003-11-11
申请日期2001-06-01
状态授权
源URL[http://ir.opt.ac.cn/handle/181661/35415]  
专题半导体激光器专利数据库
作者单位SUMITOMO ELECTRIC DEVICE INNOVATIONS, U.S.A., INC.
推荐引用方式
GB/T 7714
JOSEPH, JOHN R.,LUO, WENLIN,LEAR, KEVIN L.,et al. Method of improving the fabrication of etched semiconductor devices. US6645848. 2003-11-11.

入库方式: OAI收割

来源:西安光学精密机械研究所

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