System and method for cooling a semiconductor light source bar during burn-in testing
文献类型：专利
| 作者 | FUJII, RYUJI; WANG, QUAN BAO; CHEUNG, CHUN FEI |
| 发表日期 | 2013-08-06 |
| 专利号 | US8503493 |
| 著作权人 | SAE MAGNETICS (H.K.) LTD. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | System and method for cooling a semiconductor light source bar during burn-in testing |
| 英文摘要 | A system for cooling a semiconductor light source bar during burn-in testing includes a fixture for holding the semiconductor light source bar, and the fixture including a housing having a water inlet channel and a water outlet channel communicated with the water inlet channel; a first water tank with coolant connected with the water inlet channel; a second water tank connected with the water outlet channel; and a pumping device at least connected with the water outlet channel for pumping the coolant from the first water tank to the second water tank, thereby rushing a bottom of the semiconductor light source bar to lower the temperature thereof. The system can disperse the local heat generated during burn-in testing and uniform the local temperature of the semiconductor light source bar, thereby maintaining a proper temperature during burn-in testing and improving the heat stability of the heat assist magnetic recording head. |
| 公开日期 | 2013-08-06 |
| 申请日期 | 2012-06-18 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/37591]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | SAE MAGNETICS (H.K.) LTD. |
| 推荐引用方式 GB/T 7714 | FUJII, RYUJI,WANG, QUAN BAO,CHEUNG, CHUN FEI. System and method for cooling a semiconductor light source bar during burn-in testing. US8503493. 2013-08-06. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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