Transducer reliability testing
文献类型：专利
| 作者 | BURLAK, ALEX; BASSAT, LION; KALIFA, ITSHAK; MARGALIT, KFIR; GHANDOUR, MOREES; WEBMAN, ALON; MENTOVICH, ELAD; ROCKMAN, SYLVIE; LANDMAN, EVELYN |
| 发表日期 | 2019-02-12 |
| 专利号 | US10203366 |
| 著作权人 | MELLANOX TECHNOLOGIES, LTD. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Transducer reliability testing |
| 英文摘要 | A transducer reliability testing and VCSEL failure prediction method are provided. The method includes applying a testing temperature and a constant current to a VCSEL for a testing time. The method monitors a forward voltage of the VCSEL and determines if a first change in forward voltage is above a first predetermined threshold over the testing time and if a second change in forward voltage is above a second predetermined threshold over a portion of the testing time. The method determines failure of the VCSEL if either of these predetermined thresholds are exceeded. The method determines passage of the VCSEL if the first change in the forward voltage and the second change in the forward voltage are both below the first predetermined threshold and the second predetermined threshold, respectively. |
| 公开日期 | 2019-02-12 |
| 申请日期 | 2016-06-30 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/38163]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MELLANOX TECHNOLOGIES, LTD. |
| 推荐引用方式 GB/T 7714 | BURLAK, ALEX,BASSAT, LION,KALIFA, ITSHAK,et al. Transducer reliability testing. US10203366. 2019-02-12. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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