中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Technique to grow high quality ZnSe epitaxy layer on Si substrate

文献类型:专利

作者YANG, TSUNG-HSI; LEE, CHUNG-LIANG; YANG, CHU-SHOU; LUO, GUANGLI; CHOU, WU-CHING; CHANG, CHUN-YEN; YANG, TSUNG-YEH
发表日期2006-07-04
专利号US7071087
著作权人WITTY MATE CORPORATION
国家美国
文献子类授权发明
其他题名Technique to grow high quality ZnSe epitaxy layer on Si substrate
英文摘要A technique to grow high quality and large area ZnSe layer on Si substrate is provided, comprising growing GexSi1−x/Ge epitaxial layers on Si substrate by using ultra-high vacuum chemical vapor deposition (UHVCVD), and finally growing a ZnSe film on top Ge buffer layers. Two concepts are applied in the process of this invention, the first one is to block the dislocations generated from GexSi1−x epitaxial layers and to terminate the propagated upward dislocations by using strained interfaces, accordingly the dislocation density of ZnSe layer is greatly reduced and the surface roughness is improved; the second concept is to solve the problems of anti-phase domain due to growth of polar materials on non-polar material using off-cut angle Si substrate, and that is free from diffusion problems between different atoms while generally growing ZnSe layers on Si substrate.
公开日期2006-07-04
申请日期2004-06-03
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/38211]  
专题半导体激光器专利数据库
作者单位WITTY MATE CORPORATION
推荐引用方式
GB/T 7714
YANG, TSUNG-HSI,LEE, CHUNG-LIANG,YANG, CHU-SHOU,et al. Technique to grow high quality ZnSe epitaxy layer on Si substrate. US7071087. 2006-07-04.

入库方式: OAI收割

来源:西安光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。