光学式ヘツドのトラツキング誤差検出装置
文献类型:专利
作者 | 福本 敦; 大里 潔 |
发表日期 | 1994-01-12 |
专利号 | JP1994003649B2 |
著作权人 | SONY CORP |
国家 | 日本 |
文献子类 | 授权发明 |
其他题名 | 光学式ヘツドのトラツキング誤差検出装置 |
英文摘要 | PURPOSE:To obtain a tacking error signal of a zero-order beam unchanged by a change in a tangential skew angle to a recording medium by providing a light shield so that both side beams of a reflected beam of a recording medium are not made incident to an irradiated end face. CONSTITUTION:When a straight line connecting a center beam La and both side beams Lb, Lc toward a semiconductor laser element 1 is nearly orthogonal to an active layer 1d, for example, the light shield 9 is provided by prolonging a part of a heat sink 8, a window 9a is formed to a part of the active region 1d to the laser beam irradiating part to ensure the irradiation of a laser beam L. Then the beam reflected on a recording medium 6 and going to the semiconductor laser element 1 through a diffractive grating 3 is reflected irregularly in the light shield 9. Thus, the tracking error signal of the zero-order beam of a head OH unchanged by a change in a tangential skew angle to the recording medium is obtained. |
公开日期 | 1994-01-12 |
申请日期 | 1984-07-13 |
状态 | 失效 |
源URL | [http://ir.opt.ac.cn/handle/181661/39728] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | SONY CORP |
推荐引用方式 GB/T 7714 | 福本 敦,大里 潔. 光学式ヘツドのトラツキング誤差検出装置. JP1994003649B2. 1994-01-12. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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