中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Method of making an article comprising an oxide layer on a GaAs-based semiconductor body

文献类型:专利

作者CHEN, YOUNG-KAI; CHO, ALFRED YI; HOBSON, WILLIAM SCOTT; HONG, MINGHWEI; KUO, JENN-MING; KWO, JUEINAI RAYNIEN; MURPHY, DONALD WINSLOW; REN, FAN
发表日期2001-08-07
专利号US6271069
著作权人AGERE SYSTEMS GUARDIAN CORP.
国家美国
文献子类授权发明
其他题名Method of making an article comprising an oxide layer on a GaAs-based semiconductor body
英文摘要Disclosed are a method of making GaAs-based enhancement-type MOS-FETs, and articles (e.g., GaAs-based ICs) that comprise such a MOS-FET. The MOS-FETs are planar devices, without etched recess or epitaxial re-growth, with gate oxide that is primarily Ga2O3, and with low midgap interface state density (e.g., at most 1x1011 cm-2 eV-1 at 20° C.). The method involves ion implantation, implant activation in an As-containing atmosphere, surface reconstruction, and in situ deposition of the gate oxide. In preferred embodiments, no processing step subsequent to gate oxide formation is carried out above 300° C. in air, or above about 700° C. in UHV. The method makes possible fabrication of planar enhancement-type MOS-FETs having excellent characteristics, and also makes possible fabrication of complementary MOS-FETs, as well as ICs comprising MOS-FETs and MES-FETs. The method includes deposition of gate oxide of overall composition GaxAyOz, where Ga substantially is in the 3+ oxidation state, A is one or more electropositive stabilizer element adapted for stabilizing Ga in the 3+ oxidation state, x is greater than or equal to zero, z is selected to satisfy the requirement that both Ga and A are substantially fully oxidized, and y/(x+y) is greater than 0.
公开日期2001-08-07
申请日期1998-07-24
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/42295]  
专题半导体激光器专利数据库
作者单位AGERE SYSTEMS GUARDIAN CORP.
推荐引用方式
GB/T 7714
CHEN, YOUNG-KAI,CHO, ALFRED YI,HOBSON, WILLIAM SCOTT,et al. Method of making an article comprising an oxide layer on a GaAs-based semiconductor body. US6271069. 2001-08-07.

入库方式: OAI收割

来源:西安光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。