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Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach

文献类型：期刊论文

作者Li, Xiaowei1,2; Yan, Guihai1,2; Ye, Jing2; Wang, Ying2
刊名SCIENCE CHINA-INFORMATION SCIENCES
出版日期2018-11-01
卷号61期号:11页码:17
关键词fault tolerance on-chip self-test self-diagnosis self-repair
ISSN号1674-733X
DOI10.1007/s11432-017-9290-4
英文摘要If your computer crashes, you can revive it by a reboot, an empirical solution that usually turns out to be effective. The rationale behind this solution is that transient faults, either in hardware or software, can be fixed by refreshing the machine state. Such a "silver bullet", however, could be futile in the future because the faults, especially those existing in the hardware such as Integrated Circuit (IC) chips, cannot be eliminated by refreshing. What we need is a more sophisticated mechanism to steer the system back to the right track. The "magic cure" is the Fault Tolerance On-Chip (FTOC) mechanism, which relies on a suite of built-in design-for-reliability logic, including fault detection, fault diagnosis, and error recovery, working in a self-supportive manner. We have exploited the FTOC to build a holistic solution ranging from on-chip fault detection to error recovery mechanisms to address faults caused by chips progressively aging. Besides fault detection, the FTOC paradigm provides attractive benefits, such as facilitating graceful performance degradation, mitigating the impact of verification blind spots, and improving the chip yield.
资助项目National Natural Science Foundation of China[61532017] ; National Natural Science Foundation of China[61572470] ; National Natural Science Foundation of China[61521092] ; National Natural Science Foundation of China[61522406] ; National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61376043] ; Youth Innovation Promotion Association, CAS[Y404441000]
WOS研究方向Computer Science ; Engineering
语种英语
WOS记录号WOS:000436197800002
出版者SCIENCE PRESS
源URL[http://119.78.100.204/handle/2XEOYT63/5149]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Yan, Guihai
作者单位1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714		 Li, Xiaowei,Yan, Guihai,Ye, Jing,et al. Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach[J]. SCIENCE CHINA-INFORMATION SCIENCES,2018,61(11):17.
APA Li, Xiaowei,Yan, Guihai,Ye, Jing,&Wang, Ying.(2018).Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach.SCIENCE CHINA-INFORMATION SCIENCES,61(11),17.
MLA Li, Xiaowei,et al."Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach".SCIENCE CHINA-INFORMATION SCIENCES 61.11(2018):17.

入库方式： OAI收割

来源：计算技术研究所

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