Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback
文献类型：期刊论文
| 作者 | Wang, Wentao2; Gupta, Arushi2; Niu, Nan2; Da Xu, Li3; Cheng, Jing-Ru C.1; Niu, Zhendong4 |
| 刊名 | IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
 |
| 出版日期 | 2018 |
| 卷号 | 14期号:1页码:342-349 |
| 关键词 | Dependability dependability requirements privacy requirements tracing relevance feedback (RF) security |
| ISSN号 | 1551-3203 |
| DOI | 10.1109/TII.2016.2637166 |
| 英文摘要 | In many critical industrial information systems, tracking a dependability requirement is instrumental to the verification and validation (V&V) of security, privacy, and other dependability concerns. Automated traceability tools employ information retrieval methods to recover candidate links, which saves much manual effort. Integrating relevance feedback (RF) could potentially improve the retrieval effectiveness by soliciting the relevance judgments on a subset of the retrieval results and then incorporating the feedback into subsequent retrieval. However, little is known about how to use RF to trace dependability requirements. In this paper, we propose a novel term-based RF algorithm that leverages the term usage context to recommend positive and negative feedback. Experiments on two software datasets show that our algorithm significantly outperforms the contemporary link-based RF tracing method. Our work not only contributes a new solution to dependability requirements' V&V, but also enables further automation to reduce the manual effort in the development life cycle of dependable industrial systems. |
| 资助项目 | U.S. National Science Foundation[CCF 1350487] ; National Natural Science Foundation of China[61375053] |
| WOS研究方向 | Automation & Control Systems ; Computer Science ; Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000422661900034 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/5567]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Niu, Nan |
| 作者单位 | 1.US Army Engineer Res & Dev Ctr, Informat Technol Lab, Vicksburg, MS 39180 USA 2.Univ Cincinnati, Dept Elect Engn & Comp Syst, Cincinnati, OH 45221 USA 3.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China 4.Beijing Inst Technol, Sch Comp Sci & Technol, Beijing 100081, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, Wentao,Gupta, Arushi,Niu, Nan,et al. Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2018,14(1):342-349. |
| APA | Wang, Wentao,Gupta, Arushi,Niu, Nan,Da Xu, Li,Cheng, Jing-Ru C.,&Niu, Zhendong.(2018).Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,14(1),342-349. |
| MLA | Wang, Wentao,et al."Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 14.1(2018):342-349. |
入库方式： OAI收割
来源：计算技术研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。